One continuous discovery engine
Run high-throughput measurements across complementary analytical methods without a single sample transfer or realignment. Every result stays registered to the same reference frame, creating continuous, directly comparable data from start to finish.
24/7
Automated high-throughput material characterization by design
8+
Measurement techniques in one integrated mapping system
Physical Data for AI
Highly structured datasets for machine learning applications
Mapping-Native
Built from the ground up for spatially resolved data.
Complementary methods, one platform
Combine structural, chemical, mechanical, optical, electrical, and topographical measurements in one coordinated characterization environment.
XRD
Phase composition, texture, grain size, lattice parameters
XRF
Elemental composition
Nanoindentation
Hardness, elastic modulus
Reflectometry
Optical layer response
Ellipsometry
Refractive index, film thickness
Confocal microscopy
3D surface topography, roughness, layer morphology
Four-point probe
Sheet resistance, resistivity
Raman spectroscopy
Bonding, stress and phase fingerprints
Purpose-built for mapping
Gradients? Structured? Homogeneous? Designed from the ground up for hyper-spectral mapping. Don’t just measure your sample. Construct a continuous, precise physical and functional atlas of your material, unlocking entirely new dimensions of discovery.
Main XRD peak
37.9° 2θ42.0° 2θ
Measurement time per point
- XRD10 s
- XRF30 s
- Four-point probe30 s
- Nanoindentation20 s
- Reflectometry0.5 s
- All 293 points, all methods≈ 7.5 h
*Measured with Swissmapper on an Ag–Cu–W thin-film library: a 100 mm wafer, 293 points at 5 mm spacing.